摘要： 在分析芯片几何特征检测的基础上，根据Radon变换的基本思想，提出一种用于芯片几何特征检测的改进Radon变换算法，对该算法在矩形芯片边界直线的检测过程中确定边界直线、剔除干扰和加快速度的具体应用进行了研究。试验结果表明，与传统算法相比，该算法可以有效提高识别效率30%，同时具有鲁棒性好及检测结果准确等特点。

关键词: Radon变换, 直线检测, 图像处理, 模式识别

Abstract: Basing on analysis of geometry feature of chip and fundament of Radon transform, this paper presents a method for detecting the geometry feature of chip based on improved Radon transform. The algorithm research focuses on detecting edge lines, eliminating the disturbing and improving performance in the boundary detection process of rectangular chip. The enhancement on the efficiency of the algorithm is about 30% proved. Experimental result shows that this algorithm is robust and the result is accurate.

Key words: Radon transform, line detection, image processing, pattern recognition

中图分类号: 

• TP391.4