作者投稿和查稿 主编审稿 专家审稿 编委审稿 远程编辑

计算机工程 ›› 2009, Vol. 35 ›› Issue (7): 198-199,. doi: 10.3969/j.issn.1000-3428.2009.07.069

• 人工智能及识别技术 • 上一篇    下一篇

片状元件的自动光学检测算法

武剑洁,王永欣,邱德红,方少红   

  1. (华中科技大学软件学院,武汉 430074)
  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2009-04-05 发布日期:2009-04-05

Automatic Optical Inspection Algorithm for Chip Component

WU Jian-jie, WANG Yong-xin, QIU De-hong, FANG Shao-hong   

  1. (School of Software, Huazhong University of Science & Technology, Wuhan 430074)
  • Received:1900-01-01 Revised:1900-01-01 Online:2009-04-05 Published:2009-04-05

摘要: 表面贴装自动光学检测算法大多存在计算速度慢或对元件位置差异及图像变异敏感的问题。该文针对片状元件提出一种检测算法, 根据元件局部特征区域的灰度变化,通过引入局部主波概率,利用主波特性描述标本图像与被测元件图像之间的相似度,从而判断元件是否存在缺陷并确定缺陷种类。实验表明,该算法可缩小检测范围,降低计算量,提高算法适应性。

关键词: 自动光学检测, 片状元件, 局部主波概率

Abstract: To solve the problem of high sensitivity to position of component that exists in the algorithms widely used in Automatic Optical Inspection(AOI) for chip component, an automatic optical inspection algorithm is presented. The gray-level change of component image in local feature region is used as a detection criterion. By introducing local principal wave probability, the similarity between sample image and inspected image is described by intrinsic characteristic of the principal wave. Thus it can be decided whether the component is a defective one. The type of defect can be concluded. Experimental results show that the algorithm is effective.

Key words: Automatic Optical Inspection(AOI), chip component, local principal wave probability

中图分类号: