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计算机工程 ›› 2009, Vol. 35 ›› Issue (20): 255-257. doi: 10.3969/j.issn.1000-3428.2009.20.090

• 开发研究与设计技术 • 上一篇    下一篇

边界扫描测试优化算法

徐 丹,杨新环,晏新晃   

  1. (华东计算技术研究所,上海 200233)
  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2009-10-20 发布日期:2009-10-20

Boundary Scan Test Optimization Algorithm

XU Dan, YANG Xin-huan, YAN Xin-huang   

  1. (East China Institute of Computer Technology, Shanghai 200233)
  • Received:1900-01-01 Revised:1900-01-01 Online:2009-10-20 Published:2009-10-20

摘要: 分析全0(1)+01(10)并行序列算法、极大权值极小相异性算法、自适应完备诊断算法和遗传算法4种边界扫描测试生成算法,对比其各自的优缺点。通过DEMO板互连测试,对比测试时间和紧凑性指标,结果表明遗传算法是相对最优的算法,能生成具有抗征兆误判能力且紧凑性较好的测试矢量。

关键词: 可测试性设计, 边界扫描, 测试算法

Abstract: This paper analyses four boundary-scan test generation algorithms, including all 0(1)+01(10) parallel sequence algorithm, minimum weight and maximum dissimilarity algorithm, adaptive complete diagnosis algorithm and genetic algorithm, compares the advantage and disadvantage of each algorithm. It contrasts the test time and compact test vector through DEMO board interconnection test. Result shows that genetic algorithm is the relative best algorithm, it can generate well compactness test vector with the capacity of anti-signs miscarriage of justice.

Key words: design for testability, boundary scan, test algorithm

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