作者投稿和查稿 主编审稿 专家审稿 编委审稿 远程编辑

计算机工程 ›› 2009, Vol. 35 ›› Issue (24): 103-104. doi: 10.3969/j.issn.1000-3428.2009.24.034

• 软件技术与数据库 • 上一篇    下一篇

SPC在软件过程度量中的应用及改进

杜庆峰,马慧珺   

  1. (同济大学软件学院,上海 201804)
  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2009-12-20 发布日期:2009-12-20

Application and Improvement of Statistical Process Control in Software Process Metrics

DU Qing-feng, MA Hui-jun   

  1. (School of Software Engineering, Tongji University, Shanghai 201804)
  • Received:1900-01-01 Revised:1900-01-01 Online:2009-12-20 Published:2009-12-20

摘要: 在介绍软件过程度量原理的基础上,讨论Shewhart控制图的构成和分析方法。结合实例,分析统计过程控制在软件过程度量中的作用。针对传统Shewhart控制图无法区分软件过程之间影响的缺陷,借助选控图理论对现有方法在软件过程度量中的不足提出改进。有效区分软件过程的相互作用,定性和定量地分析软件过程的稳定性和性能。

关键词: 软件过程度量, 统计过程控制, 选控图

Abstract: This paper introduces the theory of software process metrics as well as the structure and analyzes method of Shewhart control charts. It discusses the role Statistical Process Control(SPC) plays in software process metrics using an example. As traditional Shewhart control charts can not distinguish the causes from other processes, an improvement is proposed with the help of select cause control charts, which can conquer the deficiencies in the field of software process metrics. It can analyze the stability and performance characteristics of software process both qualitatively and quantitatively.

Key words: software process metrics, Statistical Process Control(SPC), select cause control charts

中图分类号: