摘要： 针对内建自测试技术难以检测到抗随机测试故障的缺陷，提出一种充分利用测试向量中的无关位增加测试向量分组长度的方法。由含无关位的测试向量产生出相应电路内部节点的响应向量，通过分析测试向量与响应向量之间的关系，给出一些启发式规则并构建相应的有向图，用深度优先搜索方法查找出P?M个有向图的最长公共路径。实验结果表明，最大测试分组中的向量数平均增加了2.2个。
关键词:
无关位,
未知位,
内建自测试,
可测性设计
Abstract: Aiming at the defect that Build-In Self-Test(BIST) is difficult to detect the anti-random test fault, this paper presents a method to make full use of don’t care bits of test vectors to increase the length of test groups. The response vectors of interior nodes are generated from a given circuit and its test vectors which include don’t care bits. Directed graphs are built based on some heuristic rules and a longest public path is found by using depth-first search algorithm. Experimental results on the benchmark circuits demonstrate that the number of vectors in the largest test groups increase by an average of 2.2.
Key words:
don’t care bits,
unknown bits,
Build-In Self-Test(BIST),
Design For Test(DFT)
中图分类号:
杨静, 邝继顺, 尤志强. 无关位在增加测试向量分组长度上的应用[J]. 计算机工程, 2011, 37(2): 266-268.
YANG Jing, KUANG Ji-Shun, YOU Zhi-Jiang. Application of Don’t Care Bits in Increasing Length of Test Vector Groups[J]. Computer Engineering, 2011, 37(2): 266-268.