摘要: 为进一步降低测试功耗及测试应用时间,提出一种基于扫描链阻塞技术且针对非相容测试向量的压缩方法。该方法考虑前后2个测试向量之间不相容的扫描子链,后一个测试向量可以由扫描输入移入若干位以及前一个测试向量的前若干位组合而成。实验结果表明,该方法能够有效减少测试应用时间,提升效率。
关键词:
可测性设计,
扫描链阻塞,
低费用测试,
确定性测试
Abstract: For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method. The incompatible sub-scan chain between two test vectors is explored, which the latter test vector can be obtained from certain bits by its scan input and front certain bits of its former test vector. Experimental results show that this method reduces test application time effectively.
Key words:
design for testability,
scan chain disabling,
low cost test,
determinacy test
中图分类号:
刘鹏, 张云, 尤志强, 邝继顺, 彭程. 一种基于扫描链阻塞技术的低费用测试方法[J]. 计算机工程, 2011, 37(14): 254-255.
LIU Feng, ZHANG Yun, YOU Zhi-Jiang, KUANG Ji-Shun, BANG Cheng. Low Cost Test Method Based on Scan Chain Disabling Technique[J]. Computer Engineering, 2011, 37(14): 254-255.