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计算机工程 ›› 2011, Vol. 37 ›› Issue (21): 97-99. doi: 10.3969/j.issn.1000-3428.2011.21.033

• 安全技术 • 上一篇    下一篇

针对高级加密标准算法的光故障注入攻击

王红胜,宋 凯,张 阳,陈开颜   

  1. (军械工程学院计算机工程系,石家庄 050003)
  • 收稿日期:2011-04-13 出版日期:2011-11-05 发布日期:2011-11-05
  • 作者简介:王红胜(1968-),男,副教授、博士,主研方向:加密算法,信息安全,系统工程理论与应用;宋 凯,硕士;张 阳, 助教、硕士;陈开颜,副教授
  • 基金资助:
    国家自然科学基金资助项目(60940019);军械工程学院原始创新基金资助项目(YSCX0903)

Optical Fault Injection Attack on Advanced Encryption Standard Algorithm

WANG Hong-sheng, SONG Kai, ZHANG Yang, CHEN Kai-yan   

  1. (Department of Computer Engineering, Ordnance Engineering College, Shijiazhuang 050003, China)
  • Received:2011-04-13 Online:2011-11-05 Published:2011-11-05

摘要: 为获取芯片的秘密信息,针对其中的高级加密标准(AES)算法,提出一种光故障注入攻击方法。通过对开封后的微控制器进行紫外线照射,证明非易失性存储器内容能被紫外线擦除,并找出照射时间与擦除率间的关系。在AT89C52微控制器芯片上,对AES-128密码算法中的S-box进行光故障注入攻击,改变存储器单元的逻辑状态,以成功获取密钥。

关键词: 光故障注入, 紫外线照射, 旁路攻击, 高级加密标准, 非易失性存储器

Abstract: Aiming at Advanced Encryption Standard(AES) implemented on a secret chip, this paper presents an optical fault injection attack method to get the secret information from microcontroller. By using ultraviolet irradiation, the depackaged microcontroller demonstrates that the contents of nonvolatile memory can be erased, finds out the relation between irradiation time and erased bits percentage. An attack on AT89C52 microcontroller which implements AES-128 is given, the logical state of memory cell is changed, and the key can be recovered with 3 500 plaintexts.

Key words: optical fault injection, ultraviolet irradiation, Side Channel Attack(SCA), Advanced Encryption Standard(AES), non-volatile memory

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