摘要: 为获取芯片的秘密信息,针对其中的高级加密标准(AES)算法,提出一种光故障注入攻击方法。通过对开封后的微控制器进行紫外线照射,证明非易失性存储器内容能被紫外线擦除,并找出照射时间与擦除率间的关系。在AT89C52微控制器芯片上,对AES-128密码算法中的S-box进行光故障注入攻击,改变存储器单元的逻辑状态,以成功获取密钥。
关键词:
光故障注入,
紫外线照射,
旁路攻击,
高级加密标准,
非易失性存储器
Abstract: Aiming at Advanced Encryption Standard(AES) implemented on a secret chip, this paper presents an optical fault injection attack method to get the secret information from microcontroller. By using ultraviolet irradiation, the depackaged microcontroller demonstrates that the contents of nonvolatile memory can be erased, finds out the relation between irradiation time and erased bits percentage. An attack on AT89C52 microcontroller which implements AES-128 is given, the logical state of memory cell is changed, and the key can be recovered with 3 500 plaintexts.
Key words:
optical fault injection,
ultraviolet irradiation,
Side Channel Attack(SCA),
Advanced Encryption Standard(AES),
non-volatile memory
中图分类号:
王红胜, 宋凯, 张阳, 陈开颜. 针对高级加密标准算法的光故障注入攻击[J]. 计算机工程, 2011, 37(21): 97-99.
WANG Gong-Qing, SONG Kai, ZHANG Yang, CHEN Kai-Ya. Optical Fault Injection Attack on Advanced Encryption Standard Algorithm[J]. Computer Engineering, 2011, 37(21): 97-99.