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Author Login Editor-in-Chief Peer Review Editor Work Office Work
TVAC Test Method of Synchronous Full Scan Sequential Circuits
JIN Li-Yun, KUANG Ji-Shun, WANG Wei-Zheng
Computer Engineering . 2011, (12): 268 -269,272 .  DOI: 10.3969/j.issn.1000-3428.2011.12.090

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