[1] Park S C, Park M K, Kang M G. Super-resolution Image Reconstruction: A Technical Overview[J]. IEEE Signal Processing Magazine, 2003, 20(3): 21-36. [2] Gunturk B K, Gevrekci M. High-resolution Image Reconstruction from Multiple Differently Exposed Images[J]. IEEE Signal Processing Letters, 2006, 13(4): 197-200. [3] Choi B, Ra J B. Region-based Super-resolution Using Multiple Blurred and Noisy Undersampled Images[C]//Proc. of ICASSP’06. Toulouse, France: [s. n.], 2006: 609-612. [4] Baker S, Kanade T. Limits on Super-resolution and How to Break Them[J]. IEEE Trans. on Pattern Analysis and Machine Intelligence, 2002, 24(9): 1167-1183. [5] Baker S, Kanade T. Limits on Super-resolution and How to Break Them[J]. IEEE Computer Vision and Pattern Recognition, 2000, 9(2): 372-379. [6] Baker S, Kanade T. Hallucinating Faces[C]//Proc. of ICAFGR’00. Grenoble, France: IEEE Press, 2000: 83-88. [7] Freeman W T, Jones T R, Pasztor E C. Example-based Super- resolution[J]. IEEE Computer Graphics and Applications, 2002, 22(2): 56-65. [8] Chang Hong, Yeung D Y, Xiong Yimin. Super-resolution Through Neighbor Embedding[C]//Proc. of IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Washington D. C., USA: IEEE Computer Society, 2004: 275-282. [9] Su K, Tian Qi, Xue Qing, et al. Neighborhood Issue in Single Frame Image Super-resolution[C]//Proc. of IEEE International Conference on Multimedia and Expo. Amsterdam, Holland: IEEE Press, 2005: 109-124. [10] Qiao Jianping, Liu Ju, Chen Y W. Joint Blind Super-resolution and Shadow Removing[J]. IEICE Transactions on Information and Systems, 2007, E90-D(12): 2062-2069. [11] Seung H S, Lee D D. The Manifold Ways of Perception[J]. Science, 2000, 290(5500): 2268-2269. [12] 李春光. 流形学习及其在模式识别中的应用[D]. 北京: 北京邮电大学, 2007. [13] Lee D D, Seung H S. Learning the Parts of Objects by Non-negative Matrix Factorization[J]. Nature, 1999, 401(6755): 788-791. [14] Hoyer P O. Non-negative Sparse Coding[C]//Proc. of the 12th IEEE Workshop on Neural Networks for Signal Processing. Falmouth, USA: IEEE Press, 2002: 557-565.
|