摘要： 传统的广义霍夫变换空间复杂度及时间复杂度都很高，不适用于实时的应用。针对该问题，提出一种基于广义霍夫变换的芯片检测算法，降低了计算复杂度。该算法的主要思想是将多尺度分析与广义霍夫变换相结合。将该算法应用到自动光学检测系统的芯片检测中，取得了较好的检测结果。
关键词:
广义霍夫变化,
芯片检测,
物体识别
Abstract: The time and space computing complexity of the traditional Generalized Hough Transform(GHT) is too high for real-time application, so a GHT is proposed in this paper. The computing complexity is reduced in this modified Hough algorithm. The basic idea of this algorithm is combining multi-scale analysis and GHT. To verify this algorithm, chip detection in Automatic Optical Inspection(AOI) system is performed. Test results prove to be good.
Key words:
Generalized Hough Transform(GHT),
chip detection,
object recognition
中图分类号:
张小军;胡福乔. 基于广义霍夫变换的芯片检测[J]. 计算机工程, 2009, 35(23): 252-254,.
ZHANG Xiao-jun; HU Fu-qiao. Generalized Hough Transform-based Chip Detection[J]. Computer Engineering, 2009, 35(23): 252-254,.