Search
E-mail
RSS

Author Login Editor-in-Chief Peer Review Editor Work Office Work
Author Login Editor-in-Chief Peer Review Editor Work Office Work
Software Reliability Growth Model Considering Defect Correlation
ZHANG Rong-hui; JIANG Nan; GOU Lang; CHE Mei-ru; SHU Feng-di
Computer Engineering . 2008, (8): 44 -46 .  DOI: 10.3969/j.issn.1000-3428.2008.08.015

Copyright © Computer Engineering, All Rights Reserved.
Address：No. 63, Chengliu Road, Shanghai, 201808
Tel: 021-67092217　
E-mail：ecice06@ecict.com.cn
Powered by Beijing Magtech Co. Ltd,.