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计算机工程 ›› 2008, Vol. 34 ›› Issue (22): 234-235. doi: 10.3969/j.issn.1000-3428.2008.22.082

• 工程应用技术与实现 • 上一篇    下一篇

扩展相容性多扫描树的设计

刘志华1,尤志强1,张大方1,成永升2   

  1. (1. 湖南大学软件学院,长沙 410082;2. 湖南大学计算机与通信学院,长沙 410082)
  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2008-11-20 发布日期:2008-11-20

Design of Multiple Scan Tree with Extended Compatibilities

LIU Zhi-hua1, YOU Zhi-qiang1, ZHANG Da-fang1, CHENG Yong-sheng2   

  1. (1. School of Software, Hunan University, Changsha 410082; 2. School of Computer and Communication, Hunan University, Changsha 410082)
  • Received:1900-01-01 Revised:1900-01-01 Online:2008-11-20 Published:2008-11-20

摘要: 针对实际电路具有多个扫描输入的情况,设计出一种新的具有多个扫描输入的扫描树结构,该结构能有效降低测试应用时间和平均测试功耗。实验结果表明,当有两个扫描输入时,测试应用时间最高可降低52.4%,平均功耗最高可降低60.8%。

关键词: 多扫描树, 可测性设计, 全扫描测试

Abstract: With regard to the multiple scan inputs in practical circuit, a new multiple scan tree structure is designed, which reduces the test application time and average test power consumption. Experimental results show the test application time of this scheme is reduced up to 52.4% and the average power consumption is reduced up to 60.8%, when there are two scan inputs.

Key words: multiple scan tree, design for testability, full scan test

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