TTCN-3 Test System Based on Eclipse

doi:10.3969/j.issn.1000-3428.2008.20.014

Computer Engineering ›› 2008, Vol. 34 ›› Issue (20): 37-39. doi: 10.3969/j.issn.1000-3428.2008.20.014

• Software Technology and Database • Previous Articles Next Articles

TTCN-3 Test System Based on Eclipse

SHANG Si-chao, ZHAO Hui-qun, CHEN Ping

(College of Information Engineering, North China University of Technology, Beijing 100041)

Received:1900-01-01 Revised:1900-01-01 Online:2008-10-20 Published:2008-10-20

基于Eclipse平台的TTCN-3测试系统

尚思超，赵会群，陈萍

(北方工业大学信息工程学院，北京 100041)

Abstract

Abstract: This paper analyzes general structure of a TTCN-3 test system in TTCN-3 standards. It proposes architecture of a TTCN-3 test system based on Eclipse. Using Eclipse plug-in mechanism, it implements a TTCN-3 test system based on Eclipse. It discusses the function and implementation of system modules and presents the test process of the test system. Practical application shows the efficiency of the test system.

Key words: TTCN-3, test system, Eclipse, plug-in

摘要： 分析TTCN-3标准规范中的TTCN-3测试系统通用结构，提出一种基于Eclipse平台的TTCN-3测试系统体系架构。使用Eclipse的插件机制，实现TTCN-3测试环境与Eclipse平台的集成。讨论测试系统中各模块的功能及相关实现方法，阐述测试系统的具体测试流程。实际应用表明了该测试系统的有效性。

关键词: TTCN-3标准, 测试系统, Eclipse平台, 插件

CLC Number:

TP311

SHANG Si-chao; ZHAO Hui-qun; CHEN Ping. TTCN-3 Test System Based on Eclipse[J]. Computer Engineering, 2008, 34(20): 37-39.

尚思超;赵会群;陈萍. 基于Eclipse平台的TTCN-3测试系统[J]. 计算机工程, 2008, 34(20): 37-39.

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