Abstract: In the real test, using exhaustive test method will cause explosion of test case sets, low efficiency and resources wasting. Although orthogonal array can produce better test case set, its range of application is greatly restricted. This paper proposes a method named covering array to solve such problems. It takes orthogonal array and derives arrays from orthogonal array to construct covering array, which can reduce the number of testing cases, improves the efficiency of testing and increase its range of application. The algorithm is realized with .net tool, and it is proved valid and can find a more excellent test collection quickly.

Key words: test case set, covering array, parameter pair-wise combination

摘要： 在实际测试中，用穷尽法测试全部测试案例会造成测试集爆炸、效率低下及资源浪费，正交矩阵虽能生成较优测试集，但其应用范围极为受限。该文提出一种覆盖矩阵构造方法解决上述问题，该矩阵以正交矩阵及其派生矩阵为基础构造，可以减少测试案例集，扩大其应用范围，提高测试效率。用.net工具实现该算法，证明其能够有效、快速地找到一个较优测试集。

关键词: 测试案例集合, 覆盖矩阵, 参数配对组合

CLC Number: 

• TP301.6