Abstract: In terms of the problems in extended compatibility scan tree construction algorithm based on weighted compatible clique when creating compatible clique, three improvements of this algorithm are proposed by following rules: to select the scan cells which have more Xs in its test vector, to select the scan cells which have smaller degree to create XOR clique, and to allow an XOR clique to create other new XOR clique. Experimental results show this improved algorithm is more effective.

Key words: full-scan test, scan tree, test application time, test data volume

摘要： 针对基于相容类加权的扩展相容性扫描树构造算法在生成相容类时存在的问题，对其进行3个方面的改进：选取包含X的扫描单元，选取度更小的扫描单元生成异或类，异或类再进行异或生成新的异或类。实验结果表明，该改进算法是有效的。

关键词: 全扫描测试, 扫描树, 测试应用时间, 测试数据量

CLC Number: 

• TP331