Abstract: Large numbers of short run-lengths embedded in precomputed test set limit compression efficiencies of some classical code schemes. Aiming at this problem, a test-bit-rearrangement algorithm is proposed. Some same electrical level bits are fasten on ends of test patterns by a greedy algorithm to decrease number of short run-lengths. Experimental results show that several code compression schemes can not only achieve higher compression ratios in combination with the test-bit-rearrangement algorithm than those in combination with the optimization difference, but also decrease test power dissipations.

Key words: test data compression, test set, code compression, test-bit-rearrangement

摘要： 测试集中分布的大量短游程限制了经典编码压缩方案的压缩效率。针对该问题，提出一种测试位重组算法，采用一种贪婪方案把某一种电平集中到测试模式的一端，从而减少短游程。实验结果表明，与使用优化差分算法的经典压缩方案相比，使用该算法的编码压缩方案不仅能获得更高的压缩率，还能降低测试功耗。

关键词: 测试数据压缩, 测试集, 编码压缩, 测试位重组

CLC Number: 

• TP311.12