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计算机工程 ›› 2020, Vol. 46 ›› Issue (6): 202-208. doi: 10.19678/j.issn.1000-3428.0055016

• 体系结构与软件技术 • 上一篇    下一篇

基于风险轨迹与复杂网络的缺陷定位方法

王曙燕, 韩雪, 孙家泽   

  1. 西安邮电大学 计算机学院, 西安 710121
  • 收稿日期:2019-05-24 修回日期:2019-07-06 发布日期:2019-07-17
  • 作者简介:王曙燕(1964-),女,教授、博士,主研方向为软件测试、数据挖掘、智能信息处理;韩雪(通信作者),硕士;孙家泽,教授、博士。
  • 基金资助:
    陕西省科技攻关项目“基于搜索的程序并行测试数据优化关键技术”(2018GY-014);西安邮电大学研究生创新基金“基于复杂网络的软件缺陷定位技术研究”(CXJJLY2018044)。

Defect Location Method Based on Risk Trace and Complex Network

WANG Shuyan, HAN Xue, SUN Jiaze   

  1. School of Computer Science and Technology, Xi'an University of Posts and Telecommunications, Xi'an 710121, China
  • Received:2019-05-24 Revised:2019-07-06 Published:2019-07-17

摘要: 针对大规模软件系统测试过程中传统缺陷定位方法存在运行效率低下且可操作性不强的问题,提出一种基于风险轨迹与复杂网络的缺陷定位方法。动态获取程序函数调用序列,根据测试用例在不同缺陷版本程序上的执行结果,选取待测程序的目标序列与可疑序列进行比对,从而找出风险轨迹并提取可疑函数集。当可疑函数集检查完毕且未发现缺陷函数时,为待测程序建立复杂网络图,根据函数节点出度值进行排序以排除已检测的函数,生成缺陷函数候选集并最终定位缺陷函数。实验结果表明,实验结果表明,该方法相比Combine和Upper方法缺陷定位效率别提高了22.2%和12.5%,并且其在大规模软件系统上可操作性更强。

关键词: 风险轨迹, 复杂网络, 目标序列, 可疑序列, 缺陷定位

Abstract: To address the low operation efficiency and poor operability of traditional defect location methods of software testing in large software systems,this paper proposes a defect location method based on risk trace and complex network.First,the sequence of function calls of a program is obtained dynamically.Next,based on the execution results of test cases on programs with different versions of defects,the target sequence and suspicious sequence of the to-be-tested program are selected for comparison,so as to find the risk trace and extract the set of suspicious functions.Then the suspicious function set is checked.If no defect function is found,a complex network graph is built for the to-be-tested program and sorted based on the out-degree of function nodes to rule out functions that have been checked.Finally,a set of candidate defect functions is generated,and the defect function is located.Experimental results show that compared with the existing Combine and Upper methods,the proposed method canimprove the efficiency of defect location by 22.2% and 12.5% respectively,and it is more operable on large software systems.

Key words: risk trace, complex network, target sequence, suspicious sequence, defect location

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