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Computer Engineering ›› 2008, Vol. 34 ›› Issue (9): 205-207,. doi: 10.3969/j.issn.1000-3428.2008.09.074

• Artificial Intelligence and Recognition Technology • Previous Articles     Next Articles

Black-box Test Cases Auto-generating Model Based on Genetic Algorithm

PAN Zu-lie, SUN Le-chang, CAI Ming, CHEN Jian-xiong   

  1. (Department of Network Engineering, PLA Electronic Engineering Institute, Hefei 230037)
  • Received:1900-01-01 Revised:1900-01-01 Online:2008-05-05 Published:2008-05-05

基于遗传算法的黑箱测试用例自动生成模型

潘祖烈,孙乐昌,蔡 铭,陈建熊   

  1. (解放军电子工程学院网络工程系,合肥 230037)

Abstract: The technology of test cases auto-generating based on Genetic Algorithm(GA), software dynamic debugging and static disassembling is introduced. The method for calculating fitness function in GA using dynamic debugging technology is researched. The model for black-box test cases auto-generating based on GA is proposed and designed, by which test cases can be auto-generated according to the executable files without instrumentation for software source code and the application area of test cases auto-generating technology based on GA is extended.

Key words: black-box test, genetic algorithm, test cases

摘要: 介绍基于遗传算法的测试用例自动生成技术,研究了利用动态调试技术和静态反汇编技术计算遗传算法中适应度函数的方法,设计了基于遗传算法的黑箱测试用例自动生成模型。该模型可直接对可执行文件自动生成测试用例,避免对程序进行源代码插装,降低对程序源代码的要求,扩展了基于遗传算法的测试用例自动生成技术的应用范围。

关键词: 黑箱测试, 遗传算法, 测试例

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