Abstract: This paper proposes a random access scan and test approach, which deals with the compatible issue of scan unit to produce new test group. Combined with the structure character of Random Access Scan(RAS), this new test group is optimized, which solves the problems such as test data volume, test power dissipation, and test time. This approach is tested in ISCAS’89 benchmark circuits. Experimental results show this approach is effective and feasible.

Key words: compatibility, Random Access Scan(RAS), test power dissipation

摘要： 提出一种随机存取扫描测试方法，对扫描单元进行相容处理，以形成新的测试集合。结合Random Access Scan结构特性，对该测试集合进行优化，同时解决在测试工作中面临的测试数据量、测试功耗、测试时间等3方面问题。在ISCAS’89基准电路上对该方法进行验证，实验结果表明，该方法是有效可行的。

关键词: 相容性, 随机访问扫描, 测试功耗

CLC Number: 

• TP391.72