Abstract:
Aiming at the request of stability of data storage about NAND Flash, this paper analyzes the disadvantages of traditional handle scheme and proposes a handle scheme to deal with bad block based on Field-Programmable Gate Array(FPGA). It constructs bad block shield function in FPGA to shield the bad block. This method thoroughly eliminates the influence on other operation caused by bad block. By using this method, data can be successfully stored in flash and it ensures the correctness of data. This method is carried out in a project with high stability.
Key words:
Flash,
Field-Programmable Gate Array(FPGA),
bad block
摘要: 针对NAND Flash在存储数据时对可靠性的要求,分析传统坏块管理方式的弊端,提出一种基于现场可编程门阵列(FPGA)的坏块处理方案,采用在FPGA内部建立屏蔽坏块函数的方法屏蔽坏块。该方法彻底屏蔽对坏块的操作,可以实现对Flash的可靠存储。实际工程应用证明其具有较高的可靠性。
关键词:
闪存,
现场可编程门阵列,
坏块
CLC Number:
ZHANG Sheng-yong; GAO Shi-jie; WU Zhi-yong; TIAN Li-xia. Bad Block Handle Method of NAND Flash Memory Based on FPGA[J]. Computer Engineering, 2010, 36(06): 239-240.
张胜勇;高世杰;吴志勇;田丽霞. 基于FPGA的NAND Flash坏块处理方法[J]. 计算机工程, 2010, 36(06): 239-240.