摘要： 单粒子翻转所造成的软错误是阻碍微处理器设计的严峻问题,对系统模块进行软防护可以减少软错误的影响,但会增加系统的资源消耗。为找到一组合适的系统防护组合,以DSP C6701芯片为研究对象设计优化方法。建立系统代价和性能的多目标模型,同时对标准粒子群优化算法的迭代更新公式进行改进,利用改进后的离散粒子群优化算法求解所建模型。实验结果表明,该优化方法得到的防护组合能够在提高可靠性的同时,避免增加系统代价。

关键词: 数字信号处理器, 单粒子翻转, 软错误, 粒子群优化算法, 软防护

Abstract: Soft error caused by Single Event Upset(SEU) from particle striking has become a serious problem in microprocessor design.Soft protection against system can reduce the impact of soft error.Techniques to deal with these errors exist,but will increase the system cost.In order to find an appropriate system protection combination,taking the DSP C6701 chip as the research object,this paper designs an optimal method establishes the multi-objective model of the cost and performance,improves the particle iteration formula of the standard particle swarm algorithm,and applies the modified discrete Particle Swarm Optimization(PSO) algorithm to solve the proposed model.Experimental results show that the optimal method can improve the reliability and avoid increasing the cost of the system.

Key words: Digital Signal Processor(DSP), Single Event Upset(SEU), soft error, Particle Swarm Optimization(PSO) algorithm, soft protection

中图分类号: 

• TP301