摘要： 功能验证是制约集成电路设计发展的主要瓶颈，针对功能验证中存在的测试集设计难度大及覆盖模型精度低等问题，提出一种基于分类树方法的高效测试集生成方法及功能覆盖模型搭建方法，将验证方法应用于模加/模减单元的功能验证中。结果证明，运用分类树方法管理测试向量和搭建覆盖模型，可以显著提高验证完备性和可靠性。

关键词: 分类树方法, 功能验证, 测试集, 覆盖模型, 集成电路设计

Abstract: Functional verification is the major bottleneck in Integrated Circuit(IC) design. Aiming at simulation generating and coverage model issues, this paper proposes an efficient method based on Classification Tree Method(CTM). This method successfully practices on functional verification of modular addition/subtraction cell. By introducing CTM to manage simulation vectors and to construct coverage model, the integrity and reliability are improved markedly.

Key words: Classification Tree Method(CTM), functional verification, test set, coverage model, Integrated Circuit(IC) design

中图分类号: 

• TP331