摘要： 在传统的RTL级芯片测试方法的基础上,利用了XML技术强大的描述能力,提出一种基于XML技术的RTL级测试方法,并应用于DSP芯片测试中,证明了这种新方法更加高效、方便。

关键词: RTL, XML, 数字信号处理器, 数据算术逻辑单元

Abstract: This paper puts forward a chip RTL test method based on XML technology. It is based on the traditional test method and the power of XML descriptive ability. At last, it proves the validity and conveniency, by using the method to a DSP test project.

中图分类号: 

• TP306