摘要： 以工业PCB检测为研究对象,建立了一种基于Twain接口的新型AOI系统。重点研究了Twain接口的管理、颜色空间的选取和PCB瑕疵检测的方法。结合实际应用对如何提高检测速度和检测效率进行了较为深入的探讨,实验结果验证了该系统的可行性。

关键词: AOI, Twain, 颜色空间, PCB, 多参考比较法

Abstract: Focus on industrial PCB inspection, this paper designs a new-style AOI system based on Twain interface. Emphases are relaid on the management of Twain, the selection of color space and the method to detect faults. It also discusses how to speed up inspection pace and enhance the inspection performance. Experimental results indicate that this system is feasible.

中图分类号: 

• TP391.41