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计算机工程 ›› 2010, Vol. 36 ›› Issue (06): 239-240.doi: 10.3969/j.issn.1000-3428.2010.06.081

• 工程应用技术与实现 • 上一篇    下一篇

基于FPGA的NAND Flash坏块处理方法

张胜勇1,2，高世杰1，吴志勇1，田丽霞3   

  1. (1. 中国科学院长春光学精密机械与物理研究所，长春 130033；2. 中国科学院研究生院，北京 100039；3. 太原铁路局湖东车务段，大同 037003)
  • 收稿日期:1900-01-01 修回日期:1900-01-01 出版日期:2010-03-20 发布日期:2010-03-20

Bad Block Handle Method of NAND Flash Memory Based on FPGA

ZHANG Sheng-yong1,2, GAO Shi-jie1, WU Zhi-yong1, TIAN Li-xia3   

  1. (1. Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033;2. Graduate Univ. of Chinese Academy of Sciences, Beijing 100039; 3. Hudong Train Operation Depot, Taiyuan Railway Bureau, Datong 037003)
  • Received:1900-01-01 Revised:1900-01-01 Online:2010-03-20 Published:2010-03-20

PDF

1112

被引次数

53 | 4

摘要： 针对NAND Flash在存储数据时对可靠性的要求，分析传统坏块管理方式的弊端，提出一种基于现场可编程门阵列(FPGA)的坏块处理方案，采用在FPGA内部建立屏蔽坏块函数的方法屏蔽坏块。该方法彻底屏蔽对坏块的操作，可以实现对Flash的可靠存储。实际工程应用证明其具有较高的可靠性。

关键词: 闪存, 现场可编程门阵列, 坏块

Abstract: Aiming at the request of stability of data storage about NAND Flash, this paper analyzes the disadvantages of traditional handle scheme and proposes a handle scheme to deal with bad block based on Field-Programmable Gate Array(FPGA). It constructs bad block shield function in FPGA to shield the bad block. This method thoroughly eliminates the influence on other operation caused by bad block. By using this method, data can be successfully stored in flash and it ensures the correctness of data. This method is carried out in a project with high stability.

Key words: Flash, Field-Programmable Gate Array(FPGA), bad block

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