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计算机工程 ›› 2011, Vol. 37 ›› Issue (5): 249-252. doi: 10.3969/j.issn.1000-3428.2011.05.085

• 工程应用技术与实现 • 上一篇    下一篇

基于局部重配置的FPGA互连测试诊断

马珂洁,包 杰,周学功,王伶俐   

  1. (复旦大学专用集成电路国家重点实验室,上海 201203)
  • 出版日期:2011-03-05 发布日期:2012-10-31
  • 作者简介:马珂洁(1986-),女,硕士研究生,主研方向:FPGA软件系统开发,FPGA测试算法;包 杰,硕士研究生;周学功, 助理研究员;王伶俐,教授
  • 基金资助:
    国家自然科学基金资助项目(60676020);国家“863”计划基金资助重点项目(2009AA012201);上海市浦江人才计划基金资助项目(2008年);上海市科委集成电路设计基金资助专项(087062001 00)

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

MA Ke-jie, BAO Jie, ZHOU Xue-gong, WANG Ling-li   

  1. (State Key Lab of ASIC & Systems, Fudan University, Shanghai 201203, China)
  • Online:2011-03-05 Published:2012-10-31

摘要: 针对FPGA互连开关的常开、常闭、线段的开路、常0、常1故障,以及连接于同一开关矩阵的互连线段桥接故障的测试诊断问题,提出一种自动生成与应用无关的测试配置进行故障诊断的方法。通过对布线资源图中节点分方向遍历、生成全局和局部测试配置,用JTAG施加测试激励和回读结果。实验结果证明只需要较少配置时间就能够使互连故障覆盖率达到100%。

关键词: 现场可编程门阵列, 互连测试, 故障诊断, 局部重配置

Abstract: This paper presents an automatic test-configuration-generation method to test and diagnose all stuck-on, stuck-off faults in Programmable Interconnect Points(PIP), open, stuck-at faults in segments and all bridge faults between segments connecting to the same switch matrix. By searching all nodes of routing resource graph by direction, the proposed method generates total and partial configurations and then uses JTAG boundary scan chain to apply test vectors on them and readback results. Experimental results show that short time of configuration is required to cover all faults.

Key words: Field Programmable Gate Array(FPGA), interconnect test, fault diagnosis, partial reconfiguration

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