计算机工程 ›› 2019, Vol. 45 ›› Issue (1): 145-152.doi: 10.19678/j.issn.1000-3428.0048743

• 安全技术 • 上一篇    下一篇

硬件木马旁路检测方法的影响因素研究

李莹,陈岚,周崟灏   

  1. 中国科学院微电子研究所,北京 100029
  • 收稿日期:2017-09-20 出版日期:2019-01-15 发布日期:2019-01-15
  • 作者简介:李莹(1982—),女,副研究员、博士,主研方向为物联网硬件安全、集成电路设计;陈岚,研究员、博士生导师;周崟灏,高级工程师。
  • 基金项目:

    国家科技重大专项“低功耗LTE机器通信基带芯片及eSIM研发”(2016ZX03002003);北京市科技新星与领军人才培养专项(Z171100001117147)。

Research on Influencing Factor of Hardware Trojan Side-channel Detection Method

LI Ying,CHEN Lan,ZHOU Yinhao   

  1. Institute of Microelectronics of Chinese Academy of Sciences,Beijing 100029,China
  • Received:2017-09-20 Online:2019-01-15 Published:2019-01-15

摘要:

旁路检测方法通过采集电路功耗、延迟、电磁场等物理参数特性筛查硬件木马电路,但其检测性能会受到工艺波动的严重影响,且工艺的不确定性会随着芯片工艺尺寸缩小和亚阈值泄漏电流增大而增加。为此,研究硬件木马旁路检测的影响因素。通过构建旁路检测模型,在中芯国际130 nm和65 nm标准CMOS工艺下对ISCAS’85 c880基准和木马电路进行实验,结果表明,优化测试向量和适当降低电源电压能够降低工艺波动的影响,平均综合灵敏度分别提升5.60%(130 nm)和0.40%(65 nm)。同时,利用静/动态测试向量组的绝对差异比作为辅助判别依据,可降低测试向量筛选迭代次数。

关键词: 硬件木马, 旁路检测, 测试向量, 工艺波动, 影响因素

Abstract:

The side-channel detection method screens the hardware Trojan circuit by collecting physical parameters such as power consumption,delay,and electromagnetic field,but its detection performance is seriously affected by process fluctuation,and process uncertainty increases as the chip process size shrinks and the subthreshold leakage current increases.Therefore,the influencing factors of hardware Trojan side-channel detection are studied.The ISCAS’85 c880 reference and Trojan circuits are tested in a SMIC 130 nm and 65 nm standard CMOS process by building a side-channel detection model.The results show that optimizing the test vector and appropriately reducing the power supply voltage can reduce the influence of process fluctuation,and the average comprehensive sensitivity is increased by 5.60%(130 nm) and 0.40%(65 nm),respectively.At the same time,using the absolute difference ratio of the static/dynamic test vector group as the auxiliary discriminant basis,the number of test vector screening iterations can be reduced.

Key words: hardware Trojan, side-channel detection, test vector, process fluctuation, influencing factor

中图分类号: