摘要: 测试集中分布的大量短游程限制了经典编码压缩方案的压缩效率。针对该问题,提出一种测试位重组算法,采用一种贪婪方案把某一种电平集中到测试模式的一端,从而减少短游程。实验结果表明,与使用优化差分算法的经典压缩方案相比,使用该算法的编码压缩方案不仅能获得更高的压缩率,还能降低测试功耗。
关键词:
测试数据压缩,
测试集,
编码压缩,
测试位重组
Abstract: Large numbers of short run-lengths embedded in precomputed test set limit compression efficiencies of some classical code schemes. Aiming at this problem, a test-bit-rearrangement algorithm is proposed. Some same electrical level bits are fasten on ends of test patterns by a greedy algorithm to decrease number of short run-lengths. Experimental results show that several code compression schemes can not only achieve higher compression ratios in combination with the test-bit-rearrangement algorithm than those in combination with the optimization difference, but also decrease test power dissipations.
Key words:
test data compression,
test set,
code compression,
test-bit-rearrangement
中图分类号:
刘杰, 徐三子. 用于编码压缩的测试位重组算法[J]. 计算机工程, 2010, 36(21): 19-21.
LIU Jie, XU San-Zi. Test-bit-rearrangement Algorithm Applied to Code Compression[J]. Computer Engineering, 2010, 36(21): 19-21.