作者投稿和查稿 主编审稿 专家审稿 编委审稿 远程编辑

计算机工程 ›› 2021, Vol. 47 ›› Issue (2): 219-225. doi: 10.19678/j.issn.1000-3428.0057157

• 体系结构与软件技术 • 上一篇    下一篇

基于三态信号的改进游程编码压缩方法

陈田1,2, 周洋1,2, 任福继1,2,3, 安鑫1,2, 赵沪隐1,2   

  1. 1. 合肥工业大学 计算机与信息学院, 合肥 230009;
    2. 合肥工业大学 情感计算与先进智能机器安徽省重点实验室, 合肥 230009;
    3. 德岛大学 工学部, 日本 德岛 770-8506
  • 收稿日期:2020-01-08 修回日期:2020-02-20 出版日期:2021-02-15 发布日期:2020-02-24
  • 作者简介:陈田(1974-),女,副教授、博士,主研方向为超大规模集成电路、可测试性设计;周洋,硕士研究生;任福继,教授、博士;安鑫,副教授、博士;赵沪隐,学士。
  • 基金资助:
    国家自然科学基金委员会-深圳市人民政府机器人基础研究中心项目(U1613217);国家自然科学基金(61772169);合肥工业大学校级创新训练项目(X201910359441)。

Improved Run Length Coding Compression Method Based on Tri-State Signal

CHEN Tian1,2, ZHOU Yang1,2, REN Fuji1,2,3, AN Xin1,2, ZHAO Huyin1,2   

  1. 1. School of Computer and Information, Hefei University of Technology, Hefei 230009, China;
    2. Anhui Province Key Laboratory of Affective Computing and Advanced Intelligent Machine, Hefei University of Technology, Hefei 230009, China;
    3. Faculty of Engineering, Tokushima University, Tokushima 770-8506, Japan
  • Received:2020-01-08 Revised:2020-02-20 Online:2021-02-15 Published:2020-02-24

摘要: 为提高集成电路测试效率,提出一种结合三态信号的改进游程编码压缩方法。先对原始测试集进行部分输入精简处理并填充测试集的无关位,再对经过预处理的测试集根据游程长度进行变长分段处理找出最优段长。按照游程长度的出现频率对最优段长下的参考位设置编码表进行编码压缩,使用三态信号编码标志位并将编码压缩后的测试集存入自动测试设备(ATE),最终通过设计解压电路对ATE中存储的压缩数据进行无损解压。实验结果表明,在硬件开销未明显增加的情况下,该方法的测试数据平均压缩率达到74.39%,优于同类压缩方法。

关键词: 测试数据压缩, 三态信号, 游程编码, 变长分段压缩, 自动测试设备

Abstract: To improve the efficiency of integrated circuit testing,this paper proposes an improved run length coding compression method using tri-state signal.First,part of the input in the test cube is reduced,and the unrelated bits of the test set are filled.Then the variable length segment compression is performed on the pre-processed test set according to the run length to find the optimal segment length.According to the frequency of the run length,the encoding table is designed for the reference bits under the optimal segment length for coding compression. Finally,the flag bits are encoded with tri-state signals,and the encoded and compressed test set is saved into the Automatic Test Equipment(ATE).The compressed data in ATE can be decompressed without loss by designing a decompression circuit.Experimental results show that the proposed method improves the average compression ratio to 74.39% without a significant increase in the hardware overhead,which is better than other similar compression methods.

Key words: test data compression, tri-state signal, run length coding, variable length segment compression, Automatic Test Equipment(ATE)

中图分类号: