摘要： 随着IC设计的不断发展,SoC由于其可重用性而被广泛应用,这使得可测性设计(DFT)也被提高到系统级的高度。从顶层模块考虑,必须对不同模块采用不同的测试策略,合理分配测试资源。该文通过实例,提供了一种可行的系统级DFT方案。

关键词: 可测性设计, 内建自测, 扫描测试

Abstract: With the development of IC design,SoC becomes popular because of its reusability and design for test(DFT) has been considered at system level.Considering form top level,different modules should be tested under different methods and test resource should be assigned efficently.This paper presents a DFT solution system level with a real case.

中图分类号: 

• TN407