Abstract: Software Build-In-Test(BIT) is now used widely in embedded area. This paper analyses the general architecture of the embedded system, introduces three types of BIT structure pattern. For each pattern, the arithmetic design is described with real practice. It presents a new BIT approach based on fault injection. Four important phrases in this approach: test requirement analysis, fault injection, test design and result analysis are described thoroughly.

Key words: ^{embedded software,} software testability, software Build-In-Test(BIT), fault injection, software test

摘要： 针对嵌入式软件中广泛开展的软件机内测试(BIT)设计，分析通用嵌入式系统结构，提出3种软件BIT的结构模式，结合实例对每种模式的算法设计进行描述。以故障模式的概念为核心提出一种基于故障注入的软件BIT测试方法，阐述方法中的需求分析、故障注入、测试设计和结果分析4个关键步骤。

关键词: 嵌入式软件, 软件测试性, 软件机内测试, 故障注入, 软件测试

CLC Number: 

• TP311