Abstract:
According to the relationship between the interface parameters of the tested system, this paper studies the relation between interface set and bipartite graph, proposes the definition, classification and properties related to interface set, and proves these properties. It presents a graph-based test suite optimization algorithm for test suite reduction and optimization according to the properties. Through the analysis of a case, the approach can reduce the size of test suite without reducing the coverage rate of test suite and enhance the efficiency of test.
Key words:
software test,
black-box test,
bipartite graph,
test suite optimization
摘要: 根据被测系统接口参数之间的关系,研究接口参数集与二部图之间的联系,提出接口参数集的相关定义、分类和性质并证明这些性质。在此基础上提出一种基于图的测试用例集优化算法,用于约简和优化测试用例集。实例分析表明该方法能够在保持测试用例覆盖率不减的情况下,较大地减小被测系统的测试用例集规模,提高测试效率。
关键词:
软件测试,
黑盒测试,
二部图,
测试用例集优化
CLC Number:
LUO Wen-Bing, DIAO Liang, DIAO Hong-Yu. Test Suite Optimization Based on Graph Analysis[J]. Computer Engineering, 2010, 36(15): 92-93,96.
罗文兵, 赵亮, 赵洪宇. 基于图分析的测试用例集优化[J]. 计算机工程, 2010, 36(15): 92-93,96.