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›› 2005, Vol. 31 ›› Issue (17): 199-200.

• Papers • Previous Articles     Next Articles

Testing and Analysis of EM Leakiness Spectrum from Digital ITE

ZHOU Changlin, HOU Deting, CHANG Qingmei, ZHU Zhongyi   

  1. (Institute of Science, Information Engineering University, Zhengzhou 450001)
  • Published:2005-09-15

数字信息技术设备电磁泄漏频谱的测试与分析

周长林,侯德亭,常青美,朱忠义   

  1. 信息工程大学理学院,信息工程大学理学院,信息工程大学理学院,信息工程大学理学院 郑州 450001

Abstract: The mechanism analysis of EM radiation about digital ITE, such as computer, is given, and the simulation results of the differential-mode radiation about the rectangular pulse and the common-mode radiation about the tripulse in digital circuit are shown. Then, the radiation emission of PⅢ800 and displayer are measured and analyzed.

摘要: 分析了以计算机为核心的信息技术设备的电磁辐射机理,模拟出了矩型脉冲信号的差模辐射频谱和三角脉冲信号的共模辐射频谱。测试了PⅢ800计算机主机及显示器的电磁发射电场强度,并对结果进行了分析。

关键词: 电磁兼容性, 信息技术设备, 数字信号, 辐射发射, 电磁泄漏, 频谱分析

CLC Number: