Abstract: This paper proposes a test model and implement scheme of microprocessor interface unit. Random test method is adopted in this model, and constrained random test is used in stimulus generation. Experimental results show that the constrained random test model can achieve 83.68％ functional coverage and accomplish functional verification of microprocessor interface unit efficiently.

Key words: interface, functional verification, simulation, constrained random test, coverage, Godson-2

摘要： 提出了一种处理器接口测试模型，并给出了具体实现方案。该测试模型将仿真测试的方法应用于处理器接口测试，在激励生成中采用基于约束的随机测试生成方法。结果表明，基于约束的处理器接口随机测试模型的覆盖率达到83.68％，能够快速有效地完成处理器接口部件的功能验证。

关键词: 接口, 功能验证, 仿真, 约束随机测试, 覆盖率, 龙芯2号

CLC Number: 

• TP311