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计算机工程 ›› 2012, Vol. 38 ›› Issue (14): 203-205. doi: 10.3969/j.issn.1000-3428.2012.14.061

• 图形图像处理 • 上一篇    下一篇

DR图像缺陷检测的彩色合成方法

田 凯 1,2a,曾 理 1,2a,刘玲慧 2a,2b   

  1. (1. 重庆大学数学与统计学院,重庆 401331;2. 重庆大学 a. 光电技术及系统教育部重点实验室ICT研究中心;b. 光电工程学院,重庆 400044)
  • 收稿日期:2011-11-14 出版日期:2012-07-20 发布日期:2012-07-20
  • 作者简介:田 凯(1981-),男,硕士研究生,主研方向:数字图像分割,工业铸件缺陷检测;曾 理,教授、博士生导师;刘玲慧,博士研究生
  • 基金资助:

    国家自然科学基金资助项目(60972104);重庆市教委科 研基金资助项目(KJ111502)

Color Composite Method for Defect Detection of DR Image

TIAN Kai 1,2a, ZENG Li 1,2a, LIU Ling-hui 2a,2b   

  1. (1. College of Mathematics and Statistics, Chongqing University, Chongqing 401331, China; 2a. ICT Research Center, Key Laboratory of Optoelectronic Technology and System, Ministry of Education; 2b. College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China)
  • Received:2011-11-14 Online:2012-07-20 Published:2012-07-20

摘要: 数字式X射线(DR)图像难以用一幅灰度图像同时显现不同壁厚部件的缺陷。为此,提出用一幅合成彩色图像显现缺陷的方法。对DR系统扫描铸件得到的浮点型数据,采用分段灰度拉伸的方法转换为3幅灰度BMP图像,其中,不同灰度段的图像含有被测铸件不同壁厚部件的缺陷,再将这3幅灰度图像合成为一幅彩色BMP图像。对其应用彩色C-V(Chan-Vese)模型分割缺陷,实验结果证明,该彩色合成方法能较好地分割出被测铸件不同壁厚部件的缺陷。

关键词: 彩色合成, 图像分割, 缺陷检测, 数字式X射线图像, Mumford-Shah模型, Chan-Vese模型, 气孔缺陷

Abstract: Digital Radiograph(DR) image is difficult to use a gray scale image to show the defects within different thickness parts simultaneously. To address this issue, it proposes to use a synthetic color images to show defects. The floating point type data is obtained by the scanning of DR system, is converted into three grayscale BMP images by using the method of the more gray stretch, where the different grayscale images contain the casting defects of the different wall thickness, and then the synthesis of these grayscale three images is a color BMP image. Color Chan-Vese(C-V) model is exploited to segment the defects of images. Experimental results show that the color synthesis method can segment the casting defects of different wall thickness.

Key words: color composite, image segmentation, defect detection, Digital Radiography(DR) image, Mumford-Shah model, Chan-Vese(C-V) model, bubble defect

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